Methods of the learning experiment of bipolar microcircuits

The analysis of methods of the learning experiment of semiconductor microcircuits for individual forecasting of indicators of their quality has been carried out. The choice of informative parameters and means of their control has been made. The schemes of the inclusion of microcircuits in the process of research tests and the modes of their control has been justified. The analysis of constructive-technological variants of microcircuits has been carried out. A program of research tests has been developed. The results of the training experiment for microchips of the 522 series has been presented. The analysis of the experimental data has been carried out. The results of the training experiment for constructing mathematical predictive models of the quality of microcircuits has been recommended to use.