Reverse recovery failure modes in modern fast recovery diodes

In this paper, reverse recovery failure modes in modern fast power diodes are investigated. By the aid of semiconductor device simulation tools, a better view is obtained for the physical process, and operating conditions at which both diode snappy recovery and dynamic avalanching phenomenas occur during the recovery period in modern high frequency power electronic applications. The paper shows that the control of the carrier gradient and the remaining stored charge in the drift region during the recovery phase influence both failure modes and determine if the diode exhibits a soft, snappy or dynamic avalanche recovery characteristics.