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Characterization of Coupling Properties of Vertically Curved Si Surface Optical Coupler Designed for Coupling with 5-µm-MFD SMF | IEEE Conference Publication | IEEE Xplore

Characterization of Coupling Properties of Vertically Curved Si Surface Optical Coupler Designed for Coupling with 5-µm-MFD SMF


Abstract:

A 5-μm-spot-size surface optical coupler based on vertically-curved Si waveguide showed 150nm/0.5dB spectrum bandwidth, ~5dB coupling loss for TE polarization, and incide...Show More

Abstract:

A 5-μm-spot-size surface optical coupler based on vertically-curved Si waveguide showed 150nm/0.5dB spectrum bandwidth, ~5dB coupling loss for TE polarization, and incident angle and alignment tolerance of 6 degrees and ±1.5pm in 5-μm-spot SMF coupling.
Date of Conference: 11-15 March 2018
Date Added to IEEE Xplore: 14 June 2018
ISBN Information:
Conference Location: San Diego, CA, USA

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