System-level design for ESD protection on multiple IO interfaces

This paper introduces the application of system-efficient ESD design (SEED) to ESD-induced pulses that are typical for system-level ESD. Emphasis is given to USB connectors because it has been shown that discharges to the connector shell will not lead to damaging current levels; however, the current levels are sufficient to cause soft-failures and possibly lead to latch-up of the USB IC.