A novel method of impact and failure mechanism analysis of RF-based fault injection: A frequency response analyzer, FRA

This work presents a novel method to test and verify the impact and failure mechanisms of the RF interference injection on smart power integrated circuits, over of control loop circuits, checking the stability, gain and phase margin changes. The design and test algorithm is developed, as well as is proposed a robust design guide line. Theoretical analysis, simulation and test results from a silicon vehicle blocks implemented in 0.35um and 0.6um CMOS technology are presented and discussed.