Flexible architecture of memory BISTs

This paper will present a flexible Memory Built-in Self-Test (MBIST) designed to be easily adaptable to specific memory configurations and user requirements. Its RTL code is generated by means of programming scripts that provide an easy to read code without the use of complex compiler directives. The basic architecture can be adapted to different schemes of test such as parallel, in which all the memories are tested concurrently, or sequential, in which the memories are tested one at the time.