Wavelength-dependent PDL measurements in fiber gratings

Summary form only given. We present wavelength dependent polarisation dependent loss (PDL) measurements for fiber optic gratings used in reflection and transmission, by applying the Jones matrix method, the Mueller matrix method, and the polarization scanning method (also known as power min/max). These techniques are used to characterize long period gratings used in transmission for gain flattening of EDFAs, and to characterize single-channel fiber Bragg gratings (FBGs) used in reflection for dispersion compensation.