Modeling of Dependence of Dielectric Parameters of Double-layer Ferroelectric Structure on Temperature and Layers Thickness

The article presents modeling of the dielectric permeability and the angle tangent of dielectric loss of two-layer ferroelectric structure of BSTO type on temperature and the layers thickness. The described modeling way can be used in the calculation or the indirect measurement of dielectric parameters of heterogeneous structures composed of ferroelectric thin films. The formulas for estimating the errors of the modeling results of the dielectric permeability and the angle tangent of dielectric loss are made.