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Machine intelligence through 3D waferscale integration | IEEE Conference Publication | IEEE Xplore

Machine intelligence through 3D waferscale integration


Abstract:

Bringing computing systems to the stage of Machine Intelligence will require a massive scaling in processing, memory, and interconnectivity, and thus a major change in ho...Show More

Abstract:

Bringing computing systems to the stage of Machine Intelligence will require a massive scaling in processing, memory, and interconnectivity, and thus a major change in how electronic systems are designed. Long overlooked because of its unsuitability for the exacting demands of enterprise computing, 3D waferscale integration offers a promising scaling path, due in large part to the fault-tolerant nature of many cognitive algorithms. This work explores this scaling path in greater detail, invoking a simple model of brain connectivity to examine the potential for 3D waferscale integration to meet the demanding interconnectivity requirements of Machine Intelligence.
Date of Conference: 16-19 October 2017
Date Added to IEEE Xplore: 08 March 2018
ISBN Information:
Conference Location: Burlingame, CA, USA

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