An SVD-Based Approach to Reconstruct the Planar Wide-Mesh Scanning NF Data From Inaccurately Probe-Positioned Samples

A laboratory validation of an efficient singular value decomposition (SVD) approach to correct known errors in the probe positioning, affecting a nonconventional plane-rectangular near-to-far-field transformation (NTFFT) with the planar wide-mesh scanning, is here given. Such an NTFFT uses a reduced number of near-field data since those required by the standard plane-rectangular one are precisely recovered from them through a nonredundant representation of the voltage measured by the probe, achieved by considering the antenna as contained in an oblate spheroid. The values of the voltage at the sample points dictated by the representation are unknown and are efficiently retrieved from the positioning-errors affected ones through the SVD-based procedure. Some results of experimental tests, carried out at the University of Salerno and validating the efficacy of the proposed approach, are reported.