Optimum Baseline of a Single-Pass In-SAR System to Generate the Best DEM in Tidal Flats

Continuous monitoring of topographic heights and changes in tidal flats is challenging, as it is generally difficult to observe topographic changes from on-site measurements or remote sensing techniques with high resolution and high accuracy. In this regard, an interferometric synthetic aperture radar (In-SAR) can be an effective tool to generate precise digital elevation models (DEMs) and detect large-scale topographic changes. Nevertheless, utilizing the In-SAR to detect topographic changes in tidal flats is not practical because the average slope of tidal flats is usually less than 5°, and the overall spatial and temporal variations of height are not significant. Therefore, the accuracy of In-SAR DEMs must be high to detect meaningful topographic changes. In order to minimize the error of In-SAR DEMs, height of ambiguity and random phase deviation of interferograms should be taken into account. These two factors are related to incidence angle and baseline. We simulated topographic error levels in tidal flats for a single-pass In-SAR system such as TanDEM-X. Phase error of interferograms was derived using the relationship between In-SAR coherence and the probability density function of phase deviation. Signal-to-noise ratio and geometric decorrelation were formulated by the function of baseline, incidence angle, and surface slope. The simulation results show that the height error of the DEM was minimized to lower than 15 cm when the baseline was 1500 m with an incidence angle of 29° in the TanDEM-X system. Finally, the validation of simulation results was carried out by comparing them with TanDEM-X DEM accuracies in tidal flats.