Command driven scalable & programmable FPGA based digital test pattern generator

The proposed FPGA based digital Automatic Test Equipment (ATE) consists of two main design modules i.e., Digital Test Pattern generator (DTPG) & Digital Logic Analyzer. In this paper, novel FPGA approach is explained and the design and functionality COMMAND DRIVEN DTPG modules - 6 channels Frequency Synthesis block (FSB), 8×8 switch matrixes, 24 bit COMMAND Pattern Register are discussed. For all the design modules of DTPG, coding is done using Verilog HDL and simulated using Xilinx (FPGA) ISE simulator.