Cloud-Based PVT Monitoring System for IoT Devices

Reliability of an IC, concerning if an IC can function reliably over its designated lifetime in the field, has become more and more important in today's safety-critical applications. It is known that reliability can be affected by PVT effects, (Process, Voltage, Temperature). These effects not only depend on the physical locations where an IC is operated, but also vary over time. In this work, we present a cloud-based PVT monitoring system for the Internet of Things (IoT) devices, by taking advantage of its inherent internet connectivity. By doing so, one can know of the PVT status of any IoT device remotely and continually at any time and any place. With the obtained information, a potential PVT-induced failure can be alarmed in advance before it actually strikes, and thereby pre-cautious actions (such as adaptive measures, online repair, or even manual replacement) can be taken in advance to avoid unnecessary system down time.