Shape identification of extended dielectric targets in an inhomogeneous medium using Kirchhoff migration

Kirchhoff migration was applied to the fast identification of the shape and location of extended dielectric targets that were completely hidden in an inhomogeneous medium with smooth boundary. This is based on the factorization of the collected Multi-Static Response (MSR) matrix. Numerical simulations demonstrated that the use of Kirchhoff migration made it possible to detect almost all inhomogeneities.