Characteristic analysis and modeling for the near field radiation of FPGA

To predict the radiation emission of the FPGA, the radiation emission model for the chip is proposed with ICEM and the simulation result is also presented in this paper. The linear near-field surface scan system (LNFS) following electromagnetic compatibility standard is applied to measure the emission. It is illustrated that the simulation results agree with the measurements, so the value of the model for practical application is verified.