Enabling test/diagnosis of automotive semiconductor chips through FlexRay network

The demand to ensure the safety, reliability and comfort in automobiles has increased the complexity of in-vehicle electronic systems. Like mechanical maintenance, regular monitoring of the health of semiconductor chips is also important. This paper presents a framework for a low abstraction level maintenance of semiconductor chips of the vehicular network nodes through FlexRay network, while complying with the FlexRay protocol. The proposed framework is demonstrated with the scan-test data transportation.