A novel estimation technique of the permittivity and the effective thickness of dielectric materials for wideband radar systems

In this paper a novel estimation technique is introduced for a single measurement to estimate permittivity as well as the layer thickness of an object. The drawbacks of common characterization techniques, which require multiple changes in the measurement setup by sweeping the angle of incidence which just supply a narrow-band analysis of the permittivity are avoided. Furthermore, the reflection theory of multi-layer objects is briefly described so that the theoretical results are compared with measurements. By the comparison of the measurement and the simulation a validation of this model is possible. The introduced technique is ideal for autonomous security robotics where real-time conditions are necessary. Experimental validations are performed with two dielectric test objects. For the measurements the ZVB-20 network analyzer of Rohde & Schwarz is used working in a range from 4.5 GHz to 13.5 GHz.