Generation of testing actions for electronic packages

This paper examines the problem of generating testing actions for electronic industry test systems designed for verification of electronic packages of UHF band. This paper shows complex problems of setting amplitude and time parameters of multichannel generators of test signals. The problems of multichannel wide range signal generation and frequency control, rise and fall time control, pulse time and its position on the time scale. This paper also solves the problem of pulse shifts relative to each other in different channels. It suggests methods of construction of high accuracy analog and digital picosecond delay line. And shows the means of adjusting the amplitude parameters of test signal.