Implementation of BIST technology for fault detection and repair of the multiported memory using FPGA

The problem of faults is growing exponentially due to embedded memory area on-chip is increasing and memory density is growing. There are two types of memory single port and multiported comparing these two memories multiported memory have ability to support more efficient execution of operation and high speed performance. Built-in self test is used to detect and repair the faults in multiported memory. The microcode based Asynchronous p-MBIST is implemented using FPGA and compared with similar feature Synchronous P-MBIST.