Hardness assurance implications of bimodal total dose response in a bipolar linear voltage comparator

The total dose response of transistors and circuits from a single wafer lot has been measured for high and low dose rate and elevated temperature irradiations. A bimodal irradiation response is observed in the circuit response that is shown to be a result of the input transistors. Hardness assurance sampling plans are examined for their adequacy to deal with the bimodal response distributions.