Influence of high voltage pulse trimming on thick-film resistor quality indicators

High voltage pulse trimming is the most suitable resistance adjustment method for contemporary thick-film applications that impose stricter requirements on thick-film resistors. In this paper the influence of trimming by energy of high voltage pulses on two thick-film resistor quality indicators that are based on noise index measurements is being examined. Since standard characterization of trimmed thick resistive films is based on the resistance drift with little respect to the nature of observed changes, this paper aims to discuss in more detail how values of both quality indicators, that formally incorporate both transport and low-frequency noise characteristics of the resistor, change with high voltage pulse trimming and whether they can enable evaluation of resistor behavior before and after performed trimming process.