Depth measurement using frequency analysis with an active projection

We propose a method to extract depth information from a two-dimensional (2D) image. We project a sinusoidal pattern on to the object and compute the pattern's frequency as it varies with the shape of the object. The extracted frequency enables us to measure depth information. The main advantage of the proposed method is the use of only one active projected image. We expect that the proposed algorithm will be applied to vision systems, virtual environments etc. In an experiment, the algorithm showed a mean error of about 2.44 percent in measuring depth compared with ground truth.