Single-Event Transients in Readout Circuitries at Low Temperature Down to 50 K

This paper presents the impact of cryogenic temperatures, down to 50 K, on the single-event transient (SET) sensitivity of two readout circuits of infrared image sensor designed by Sofradir. Experimental SETs data obtained under heavy ions at the Université Catholique de Louvain la Neuve facility are described, and the temperature impact on the SET cross sections is presented. The analysis of experimental sensitivity trends is completed by means of MUSCA SEP3 tool.