Analysis of dislocation configurations in a [0 0 1] fcc single crystal by electron channeling contrast imaging in the SEM

We have investigated the dislocation configurations in a [0 0 1] single crystal of a face-centered alloy (316L stainless steel) by the electron channeling contrast imaging (ECCI) technique in the scanning electron microscope under controlled diffraction conditions. Specific dislocations such as piled-up dislocations and Lomer-Cottrell dislocations were characterized by the analysis of dislocation contrast and dislocation line trace analysis. The ECCI technique also allows the sound estimation of the local resolved stress acting on gliding dislocations by the analysis of the radius of curvature following a transmission electron microscopy-based geometrical approach.