Contribution to electrical fast transient/burst modelling

In order to determine the instability of any electronic device during the design process, electrical fast transients/burst (EFT/B) may be applied successively on the main power and input/output (I/O) ports. This non-destructive test points out several errors in the design. Protection against this disturbance on the power supply ports of the device may be defined rather easily. However concerning the I/O ports, the task becomes tougher. This paper describes a study of the parasitic currents and voltages generated on the I/O ports undergoing EFT/B through a standardized capacitive coupling clamp (standard IEC 61000-4-4) in order to find an equivalent Thevenin's generator of the association: the EFT/B generator/capacitive coupling clamp.