A high fault coverage march test for 1T1R memristor array

March W-1T1R, a high fault coverage March test, is proposed to cover not only the tranditional fault set, but also the newly discovered write disturbance fault (WDF) and dynamic write disturbance fault (dWDF) in 1T1R memristor arrays. The analysis shows that the March W-1T1R algorithm with complexity of 17N, where N is the number of memory cells in the array, enhances the fault coverage only with the little time complexity increasement, comparing with the previous March algorithms.