A Linear Model for Microwave Imaging of Highly Conductive Scatterers

In this paper, a linear model based on multiple measurement vectors' model is proposed to formulate the inverse scattering problem of highly conductive objects at one single frequency. Considering the induced currents that are mostly distributed on the boundaries of the scatterers, joint sparse structure is enforced by a sum-of-norm regularization. Since no a priori information is required and no approximation of the scattering model has been made, the proposed method is versatile. Imaging results with transverse magnetic and transverse electric polarized synthetic data and Fresnel data demonstrate its higher resolving ability than both linear sampling method and its improved version with higher, but acceptable, computational complexity.