Statistics of fluctuation in the response of cavities excited by noisy sources

Emissions from modern electronic circuitry are inherently complex and necessarily statistically characterized. The goal in this work is to characterise such emissions as they operate in a realistic environment. When the surrounding environment is electromagnetically large, or complex, the problem of simulating such emissions is further compounded by the intractability of full EM wave modeling: at high enough frequencies, approximate methods based on ray tracing may be the only feasible approach. In this paper, we present a statistical description of fluctuations in the high-frequency response of complex or ray-chaotic cavities to such stochastic sources. It is based on a method proposed in [1], which exploits information available as a byproduct of ray-tracing simulations to predict in addition to the averaged intensity that is typically obtained directly from ray tracing, higher moments which characterize fluctuations about the mean response. This paper extends that approach to provide full statistical distributions of the intensity when damping is moderate and under assumptions that multiple reflections in the surrounding environment are sufficiently randomizing.