A Circuit Modeling Technique for the ISO 7637-3 Capacitive Coupling Clamp Test

In this paper, we propose a transmission-line modeling technique for the ISO 7637-3 capacitive coupling clamp (CCC) test. Besides modeling the test bench, special attention is devoted to the CCC itself, for which an equivalent circuit is constructed based on the concept of surface transfer impedance and surface transfer admittance. The overall model is validated by means of measurements using a nonlinear circuit as device-under-test, as such demonstrating the appositeness to mimick the CCC test in simulations during the design phase.