Near-field scanning of stochastic fields considering reduction of complexity

Near-field scanning is an established technique for the efficient and accurate measurement of the radiated emissions from electronic equipment for EMC studies. Recently the use of two probes near-field has been developed for the measurement of field correlation for electronic equipment with many uncorrelated sources that essentially have a stochastic field distribution. The use of two probe scanning is however very time consuming and requires large computer resources. In this paper a study is made of the emissions from typical electronic devices to look at methods for reducing the complexity of measurement of stochastic fields.