Crosstalk analysis of printed circuits with many uncertain parameters using sparse polynomial chaos metamodels

This paper presents a metamodel based on the sparse polynomial chaos approach, well adapted to high-dimensional uncertainty quantification problems, applied for the analysis of crosstalk in printed circuit board microstrip traces. It enables to estimate, with a low computational cost compared to Monte Carlo (MC) simulation, statistical quantities and provides a sensitivity analysis of the crosstalk effects considering numerous uncertain variables. The approach is validated against MC simulation and shows a good efficiency and accuracy.