Identifying and quantifying mineral abundance through VSWIR microimaging spectroscopy: A comparison to XRD and SEM

Visible-shortwave infrared microimaging reflectance spectroscopy is a new technique to identify minerals, quantify abundances, and assess textural relationships at sub-millimetre scale without destructive sample preparation. Here we used a prototype instrument to image serpentinized igneous rocks and carbonate-rich travertine deposits to evaluate performance, relative to traditional techniques: XRD (mineralogical analysis of bulk powders with no texture preservation) and SEM/EDS (analysis of phases and textures using chemical data from polished thin sections). VSWIR microimaging spectroscopy is ideal for identifying spatially coherent rare phases, below XRD detection limits. The progress of alteration can also be inferred from spectral parameters and may correspond to phases that are amorphous in XRD. However, VSWIR microimaging spectroscopy can sometimes be challenging with analyses of very dark materials (reflectance <0.05) and mineral mixtures occurring at a spatial scales multiple factors below the pixel size. Abundances derived from linear unmixing typically agree with those from XRD and EDS within ∼10%.