Fluctuation of correlation within enclosures

Emission from complex EM sources may be characterised by measurements of two-point correlations functions, which contain directional as well as positional information for radiated power. When such sources radiate within enclosures, the average power arising from multiple reflection can be modelled by ray tracing techniques. In this paper we describe how a bootstrapping method may be employed which exploits information gained as part of such ray-tracing simulations to provide additional information regarding fluctuation about the mean.