Electro optical probing / frequency mapping (EOP/EOFM) application in failure isolation of advanced analogue devices

Successful failure isolation from front side becomes very expensive and time consuming as the technology nodes becoming increasingly difficult. Electro Optical Techniques, composed of Electro Optical Frequency Mapping (EOFM) and Probing (EOP), are dynamic optical analysis techniques. Most EOP/EOFM applications have focused on design debug or design characterization of integrated circuits (ICs), but these techniques are seldom used for global functional failure isolation. In this paper, we discussed the implementation of EOP/EOFM applications in global functional failure isolation of the advanced analogue devices. Two kinds of failure mode (SPI logic faulty and timing delay issue) are talked in this paper, in both case, EOP/EOFM made the difference between successful electrical isolation and successful root cause identification.