Statistical analysis on variation tolerance of time-shared Twin Memristor Crossbar for pattern matching

In this paper, we analyze the variation tolerance of time-shared Twin Memristor Crossbar (TMC) for various inter-correlation and intra-correlation parameters. Here the percentage variation in memristance is increased from 0% to 40%. The statistical analysis performed here indicates the original TMC and the time-shared TMC show almost the same tolerance to memristance variation when the variation of all memristors in one array are assumed random, referred to as intra-array correlation is zero. However, when the intra-array correlation becomes as high as 1, in other words, variations of all memristors in the same array are correlated each other, the time-shared TMC shows better recognition rate by 5% on average, compared to the original TMC. From the statistical simulation results, we can expect the time-shared TMC has better variation-tolerance than the original TMC, in pattern matching application.