Effect of Cr sub-seed layer thickness on the crystallographic orientation of Co-alloy recording media on glass

Films with Cr sub-seed layer/NiAl/Cr-alloy/Co-alloy structure were sputter-deposited on surface-oxidized NiP layers on glass substrates. The effects of Cr sub-seed layer thickness on crystallographic orientation, grain size distribution, magnetic properties and recording performance were investigated. The recording performance of uni-crystal and bi-crystal media is compared and its correlation with grain size is discussed.