Characterisation of FeBSiC coated MFM tips using Lorentz electron tomography and MFM

Magnetic force microscope (MFM) tips coated with an amorphous ferromagnetic alloy have been studied using MFM and Lorentz electron microscopy. Imaging a standard NIST hard disk sample in the MFM reveals that the character of the tips varies dramatically with film thickness. The stray field distributions of the tips were determined using Lorentz electron tomography, and were found to be consistent with the contrast observed by MFM.