Complex chaotic measurement: New concept and basic case

Along the logical route of IC test technology reviewing the five blocks of the basic active measurement for system or device under test, we suggest using the apt chaotic circuit as every module for searching novel high yields. To select the Boolean chaotic circuit as supply power, we can fuse I
_ddq
and I
_ddt
into one novel parameter named I
_ddc
representing faults' information in DUT. To verify this idea in complex chaotic measurement paradigm, we build 3D IC as 3D-RLC under test, insert three kinds of elassic faults in weak open circuit, short circuit and bridging fault, and the simulation results show that the chaotic phase figure of up I
_ddc
and down I
_ddc
will reveal the implanted fault's type with chaotic measurement principles of initial value sensitivity and random amplification. Another simulation case is analyzed with three-area changes on modified Boolean chaotic Vdd testing for new I
_ddt
.