Investigation of the probe-factor deconvolution methods for dynamic ESD fields measurements

Accurate measurements of electromagnetic fields are essential to analyze the radiated noise due to unwanted electrostatic discharge (ESD) events at electronic devices. Usually, to know the radiated noise by ESD events, the voltages induced at field probes are measured, and the fields are obtained from the voltage by de-convolving the probe factor. In this paper, the two probe-factor deconvolution methods are investigated and compared in the measurements of the fields induced by system-level ESD events.