Integrated method for impedance and low frequency noise measurements

Impedance and low frequency noise measurements are valuable and complementary methods for electron device characterization. In this work we propose an integrated method for impedance and low frequency noise measurements in which impedance measurements are performed by means of crosscorrelation low frequency noise measurements. The method is implemented in a three-channel measurement system for the automatic DC, Gate-Drain low frequency noise, and impedance characterization of electron devices. Method and system operations are described and validated by means of measurements on known reference devices.