Fast Electromagnetic Characterization of Integrated Circuit Passive Isolation Structures Based on Interference Blocking

An early characterization of integrated circuit passive isolation structures is crucial to predict their performance and effectiveness in minimizing substrate coupling. In this paper, an electromagnetic (EM) modeling methodology is proposed, which can be applied to different types of isolation structures based on interference blocking. It consists in characterizing the different doping profiles by identifying those propagation modes with a greater contribution to substrate coupling and to the aggressor-victim transfer function. This allows a fast EM characterization, providing insight on the different isolation mechanisms, identification of transitory effects, and a fast prediction of isolation effectiveness.