Transistor test bench for Gummel-Poon modehng in circuit technology courses

In this paper a test bench for transistors and bipolar junction transistors in particular is presented. The transistor test bench is completely developed in a student thesis work and can measure the transistor's static characteristics and the dynamic behaviour up to 1 GHz. The test bench concluded of a self-developed vector network analyzer, two biasing voltage sources, two bias-tees on a mother printed circuit board (PCB) and transistors under test (TUT) on a daughter PCB. Based on the measurement data the parameters of the Gummel-Poon model will be determined by hand or automatically. This helps the students to comprehend the Gummel-Poon model and to understand the formulas and the parameters of the model.