High speed remote sensing of process parameters using STM32

Sensing process parameter is imperative for signal readout in radiation detectors, exclusively in the ionization chamber which are widely used for the measurement of flux of the ionizing radiations. The presented work aims to describe an advanced data acquisition system for accurate measurement of the parameters. A circuit is designed and developed for sensing process parameter that is ionization current using all in one 32-bit microcontroller STM32F401RE for ionization chamber data acquisition.