Bridging the Gap in noise spectral density measurements derived from flicker and noise figure measurement systems

A unique, experimental analysis is provided on ultra-broad-band noise data for high frequency BJT and FET transistors derived from multiple test setups. These setups include a traditional in-house flicker noise measurement system (to 100kHz), and a new commercially available broad-band low frequency noise measurement system (to 40MHz), along with higher frequency microwave noise figure system (utilized for 10MHz-40GHz) and noise parameter test system (used for 2-40GHz data). Using noise spectral density and noise figure representations, data from several on-wafer device devices, obtained from four different test systems are examined and merged over frequency. Surprisingly consistent agreement is observed in the broad-band frequency trends of the low frequency flicker noise measurement systems and higher frequency microwave noise test systems with the newer broadband commercial system seen to successfully `bridge the gap' between traditional flicker noise measurement upper frequency limits and the lower limits of microwave noise figure and noise - parameter test systems.