Loading [a11y]/accessibility-menu.js
A novel burn-in potential region detection method using image processing technique | IEEE Conference Publication | IEEE Xplore

A novel burn-in potential region detection method using image processing technique


Abstract:

The organic light emitting diode (OLED) display has been widely adopted to various multimedia devices with superior performance in terms of image quality and power effici...Show More

Abstract:

The organic light emitting diode (OLED) display has been widely adopted to various multimedia devices with superior performance in terms of image quality and power efficiency. However, the luminance degradation of the OLEDs, called burn-in, is still one of the major problems. This paper presents a novel method of detecting the burn-in potential region (BPR) to alleviate the luminance degradation. First, in order to extract the burn-in potential pixels (BPPs) which deteriorate the uniformity of the display, we calculate the remaining lifetime of OLED of each pixel. Then, the BPRs are detected by the level set based image segmentation using the BPPs as the seed points. The experimental results demonstrate that the proposed method detects BPRs with superior effectiveness compared with other alternative methods.
Date of Conference: 08-10 January 2017
Date Added to IEEE Xplore: 30 March 2017
ISBN Information:
Electronic ISSN: 2158-4001
Conference Location: Las Vegas, NV, USA

Contact IEEE to Subscribe

References

References is not available for this document.