The failure of traditional methods of determining statistical distribution functions of the units of vacuum and plasma electronics

It has been shown that traditional diagnostic methods associated with the solution of inverse problems described by Fredholm integral equation of the 1st kind from a mathematical point of view, are failure, because they do not take into account their ill posed problems. The ill posed problems is connected c on the one hand with the ambiguity of the inverse problem solution and on the other hand with a huge quantity of a matrix of transition from the experimental results to the desired values. Proposed diagnostic method associated with functional Tikhonov minimization. Monte Carlo method the convergence to the exact solution with an error of initial information tends to zero. The practical results of applying the proposed method for the diagnosis of the distribution function in the emission, plasma, solid and nano-electronics.