Wire and aperture probe modeling in planar near-field scanning

The use of planar near-field scanning is well developed in characterizing the far-field behavior of directive antennas
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. One of the important steps in predicting the far-field is the correction of the averaging effect introduced by the finite size of the probe used in the field measurement, and the methods of correction are well developed in this context
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. The existing formulation utilizes the complex radiation pattern of the probe as a basis for finding the radiation pattern of the antenna under test. This approach is useful when dealing with highly directive antennas and the resulting formulae are usually well-conditioned. However, there are cases when the antenna under test is nondirective or the near-field measurements are intended to collect data for an inverse problem. It is, then, important to investigate the behavior of the field probes for general incident fields.