WIPE: Wearout Informed Pattern Elimination to Improve the Endurance of NVM-based Caches

With the recent development in Non-Volatile Memory (NVM) technologies, several studies have suggested using them as an alternative to SRAMs in on-chip caches. However, limited endurance of NVMs is a major challenge when employed in the caches. This paper proposes a data manipulation technique, so-called Wearout Informed Pattern Elimination (WIPE), to improve the endurance of NVM-based caches by reducing the activity of frequent data patterns. Simulation results show that WIPE improves the endurance by up to 93% with negligible overheads.