Development of basic fault model and corresponding ATPG for single input missing cell deposition defects in Majority Voter of QCA

Defects and hence faults are present in the QCA (Quantum-dot Cellular Automata) nanotechnology devices and circuits. Hence it is important to test these nanotechnology devices and circuits. This paper investigates the new properties for the test generation for the QCA device majority voter. A method of test generation is developed to find the single missing input cell deposition defects in the QCA majority voter using the proposed properties. The generated test vectors are verified using algebraic method. The generated test vectors are mapped at the QCA layout level to validate capability to detect the single input missing cell deposition defect.