Kicking the tires of the NIST microwave uncertainty framework, part 1

As with anything new, especially metrology tools, you want to know how good the new tool is. This is generally done through comparisons with existing systems. In this paper, such a comparison is described. The new NIST method of processing measurements and uncertainties, the Microwave Uncertainty Framework will be compared to the established NIST method for measuring one and two-port scattering-parameters. The setup of the comparison, results, and a discussion of the results will be covered. This paper, Part 1, will cover the comparison of the responses generated by the different methods. Part 2 will discuss the comparison of the uncertainties calculated with the different approaches.